- Part Status :
- Operating Temperature :
- Package / Case :
-
- 14-SOIC (0.154", 3.90mm Width) (1)
- 16-SOIC (0.154", 3.90mm Width) (10)
- 16-SOIC (0.209", 5.30mm Width) (3)
- 20-SOIC (0.209", 5.30mm Width) (2)
- 20-SOIC (0.295", 7.50mm Width) (6)
- 20-SSOP (0.209", 5.30mm Width) (2)
- 20-TSSOP (0.173", 4.40mm Width) (3)
- 24-SOIC (0.295", 7.50mm Width) (20)
- 24-TSSOP (0.173", 4.40mm Width) (1)
- 28-BSSOP (0.295", 7.50mm Width) (6)
- 28-LCC (J-Lead) (2)
- 28-SOIC (0.295", 7.50mm Width) (13)
- 28-SSOP (0.209", 5.30mm Width) (2)
- 44-LCC (J-Lead) (1)
- 48-BSSOP (0.295", 7.50mm Width) (4)
- 48-TFSOP (0.240", 6.10mm Width) (4)
- 52-QFP (6)
- 56-BSSOP (0.295", 7.50mm Width) (3)
- 56-TFSOP (0.240", 6.10mm Width) (4)
- 64-LQFP (3)
- Supplier Device Package :
-
- 14-SOIC (1)
- 16-SO (5)
- 16-SOIC (8)
- 20-SO (3)
- 20-SOIC (5)
- 20-SSOP (2)
- 20-TSSOP (3)
- 24-SO (1)
- 24-SOIC (19)
- 24-TSSOP (1)
- 28-PLCC (11.51x11.51) (1)
- 28-PLCC (11.5x11.5) (1)
- 28-SO (1)
- 28-SOIC (12)
- 28-SSOP (8)
- 44-PLCC (16.58x16.58) (1)
- 48-SSOP (4)
- 48-TSSOP (4)
- 52-QFN (10x10) (1)
- 52-QFP (10x10) (5)
- 56-SSOP (3)
- 56-TSSOP (4)
- 64-LQFP (10x10) (3)
- Logic Type :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (3)
- Addressable Scan Ports (2)
- Arithmetic Logic Unit (3)
- Binary Full Adder with Fast Carry (12)
- Buffer/Driver with Parity (1)
- Bus Arbiter (1)
- Bus Termination Array (3)
- IEEE STD 1284 Translation Transceiver (14)
- Incident-Wave Switching Bus Transceivers (4)
- Memory Decoder (1)
- Parity Generator/Checker (6)
- Scan Test Device with Buffers (1)
- Scan Test Device with Bus Transceiver and Registers (9)
- Scan Test Device with Bus Transceivers (4)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (3)
- Scan Test Device with D-Type Latches (3)
- Scan Test Device with Inverting Buffers (3)
- Scan Test Device with Inverting Bus Transceivers (5)
- Scan Test Device with Registered Bus Transceiver (8)
- Scan Test Device with Universal Bus Transceivers (2)
- SCAN-PATH LINKERS (1)
- Test Bus Controller (1)
- TTL/BTL Transceiver/Translator (6)
- Applied Filters :
96 results
| Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| GLOBAL STOCKS | |||||||||||||||||
|
RFQ |
2,850
In-stock
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
|
|
RFQ |
1,273
In-stock
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
|
RFQ |
3,163
In-stock
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28PLCC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | |||
|
RFQ |
780
In-stock
|
NXP USA Inc. | IC BINARY FULL ADDER 4BIT 16SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SO | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | |||
|
RFQ |
1,801
In-stock
|
ON Semiconductor | TXRX BIDIRECT IEEE 48TSSOP | 74VHC | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP | 4.5 V ~ 5.5 V | 8 | IEEE STD 1284 Translation Transceiver | |||
|
|
RFQ |
3,125
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
RFQ |
3,642
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
|
RFQ |
1,743
In-stock
|
NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | |||
|
|
RFQ |
3,501
In-stock
|
NXP USA Inc. | IC ARBITER BUS 5.5V 16SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SO | 4.5 V ~ 5.5 V | 4 | Bus Arbiter | |||
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|
1,843
In-stock
|
Texas Instruments | IC TEST-BUS CONTROLLER 44-PLCC | 74ACT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 44-LCC (J-Lead) | 44-PLCC (16.58x16.58) | 4.5 V ~ 5.5 V | 16 | Test Bus Controller | ||||
|
3,739
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
|
|
2,194
In-stock
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||||
|
1,929
In-stock
|
Texas Instruments | IC 16BIT I-WS BUS TXRX 48-SSOP | 74ABTE | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP | 4.5 V ~ 5.5 V | 16 | Incident-Wave Switching Bus Transceivers | ||||
|
|
3,343
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||||
|
|
3,168
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||||
|
1,424
In-stock
|
Texas Instruments | IC BIN FULL 4BIT ADD CAR 16SOIC | 74HCT | Active | Tape & Reel (TR) | -55°C ~ 125°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | ||||
|
|
3,060
In-stock
|
Texas Instruments | IC BIN FULL 4BIT ADD CAR 16SOIC | 74HCT | Active | Tape & Reel (TR) | -55°C ~ 125°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | ||||
|
RFQ |
1,365
In-stock
|
Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | |||
|
|
RFQ |
2,925
In-stock
|
Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | |||
|
|
RFQ |
2,122
In-stock
|
Texas Instruments | IC FULL ADDER 4BIT BIN 16-SOIC | 74F | Discontinued at Digi-Key | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | |||
|
|
RFQ |
3,317
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
3,250
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
RFQ |
2,454
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
3,808
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
RFQ |
1,959
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Discontinued at Digi-Key | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
|
|
RFQ |
2,312
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
|
RFQ |
3,215
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
|
RFQ |
2,580
In-stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
|
|
RFQ |
750
In-stock
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
|
RFQ |
2,209
In-stock
|
Texas Instruments | IC DECODER MEM DUAL 2-4 20-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 75°C | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC | 4.5 V ~ 5.5 V | - | Memory Decoder | |||
